微电子可靠性 SCIE

期刊简介预计审稿时间： 较快,2-4周 约8.3周

Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

Most accepted papers will be published as Research Papers, describing significant advances and completed work. Papers reviewing important developing topics of general interest may be accepted for publication as Review Papers. Urgent communications of a more preliminary nature and short reports on completed practical work of current interest may be considered for publication as Research Notes. All contributions are subject to peer review by leading experts in the field.

《微电子可靠性》致力于传播微电子设备、电路和系统可靠性的最新研究成果和相关信息，涵盖材料、工艺和制造、设计、测试和操作等各个方面。该期刊涵盖以下主题：测量、理解和分析；评估和预测；建模和仿真；方法和缓解。将可靠性与微电子工程其他重要领域（如设计、制造、集成、测试和现场操作）相结合的论文也将受到欢迎，并且特别鼓励报告该领域和特定应用领域案例研究的实践论文。

大多数被接受的论文将以研究论文的形式发表，描述重大进展和已完成的工作。回顾普遍感兴趣的重要发展主题的论文可能会被接受作为评论论文发表。更初步的紧急通讯和关于当前感兴趣的已完成实践工作的简短报告可能会被考虑作为研究笔记发表。所有投稿均需经过该领域顶尖专家的同行评审。

《Microelectronics Reliability》(微电子可靠性)编辑部通讯方式为PERGAMON-ELSEVIER SCIENCE LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB。如果您需要协助投稿或润稿服务，您可以咨询我们的客服老师。我们专注于期刊投稿服务十年，熟悉发表政策，可为您提供一对一投稿指导，避免您在投稿时频繁碰壁，节省您的宝贵时间，有效提升发表机率，确保SCI检索（检索不了全额退款）。我们视信誉为生命，多方面确保文章安全保密，在任何情况下都不会泄露您的个人信息或稿件内容。