表面和界面分析 SCIE

期刊简介预计审稿时间： 约4.4个月

Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).

《表面与界面分析》致力于发表有关表面、界面和薄膜表征技术开发和应用的论文。特别欢迎有关标准化和量化的论文，以及有关将这些技术应用于工业问题的论文。纯理论方面的论文也将予以考虑。将发表评论文章；在这种情况下，建议事先咨询其中一位编辑。论文必须具有该领域的科学价值，并将提交给两名独立审稿人。投稿必须为英文，且不得在其他地方发表，作者必须同意不将同一材料转交给其他任何期刊发表。作者可向 John Watts（仅限英国）、Jose Sanz（欧洲其他地区）、John T. Grant（除日本外的所有非欧洲国家）或 R. Shimizu（仅限日本）提交论文以供发表。

《Surface And Interface Analysis》(表面和界面分析)编辑部通讯方式为JOHN WILEY & SONS LTD, THE ATRIUM, SOUTHERN GATE, CHICHESTER, ENGLAND, W SUSSEX, PO19 8SQ。如果您需要协助投稿或润稿服务，您可以咨询我们的客服老师。我们专注于期刊投稿服务十年，熟悉发表政策，可为您提供一对一投稿指导，避免您在投稿时频繁碰壁，节省您的宝贵时间，有效提升发表机率，确保SCI检索（检索不了全额退款）。我们视信誉为生命，多方面确保文章安全保密，在任何情况下都不会泄露您的个人信息或稿件内容。