IEEE Transactions on Device and Materials Reliability SCIE

期刊简介预计审稿时间： 较慢,6-12周

The scope of the publication includes, but is not limited to Reliability of: Devices, Materials, Processes, Interfaces, Integrated Microsystems (including MEMS & Sensors), Transistors, Technology (CMOS, BiCMOS, etc.), Integrated Circuits (IC, SSI, MSI, LSI, ULSI, ELSI, etc.), Thin Film Transistor Applications. The measurement and understanding of the reliability of such entities at each phase, from the concept stage through research and development and into manufacturing scale-up, provides the overall database on the reliability of the devices, materials, processes, package and other necessities for the successful introduction of a product to market. This reliability database is the foundation for a quality product, which meets customer expectation. A product so developed has high reliability. High quality will be achieved because product weaknesses will have been found (root cause analysis) and designed out of the final product. This process of ever increasing reliability and quality will result in a superior product. In the end, reliability and quality are not one thing; but in a sense everything, which can be or has to be done to guarantee that the product successfully performs in the field under customer conditions. Our goal is to capture these advances. An additional objective is to focus cross fertilized communication in the state of the art of reliability of electronic materials and devices and provide fundamental understanding of basic phenomena that affect reliability. In addition, the publication is a forum for interdisciplinary studies on reliability. An overall goal is to provide leading edge/state of the art information, which is critically relevant to the creation of reliable products.

出版物的范围包括但不限于以下方面的可靠性：设备、材料、工艺、接口、集成微系统（包括 MEMS 和传感器）、晶体管、技术（CMOS、BiCMOS 等）、集成电路（IC、SSI、MSI、LSI、ULSI、ELSI 等）、薄膜晶体管应用。从概念阶段到研发再到制造规模，在每个阶段对这些实体的可靠性进行测量和理解，为成功将产品推向市场提供了设备、材料、工艺、封装和其他必需品的可靠性的整体数据库。这个可靠性数据库是满足客户期望的优质产品的基础。这样开发的产品具有高可靠性。高质量将实现，因为产品弱点将被发现（根本原因分析）并在最终产品中设计出来。这个不断提高可靠性和质量的过程将产生卓越的产品。归根结底，可靠性和质量不是一回事；但从某种意义上说，我们可以做或必须做一切事情来保证产品在客户条件下在现场成功运行。我们的目标是抓住这些进步。另一个目标是关注电子材料和设备可靠性的最新进展，并提供对影响可靠性的基本现象的基本理解。此外，该出版物还是可靠性跨学科研究的论坛。总体目标是提供前沿/最新信息，这些信息与可靠产品的创造至关重要。

《Ieee Transactions On Device And Materials Reliability》(IEEE Transactions on Device and Materials Reliability)编辑部通讯方式为IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141。如果您需要协助投稿或润稿服务，您可以咨询我们的客服老师。我们专注于期刊投稿服务十年，熟悉发表政策，可为您提供一对一投稿指导，避免您在投稿时频繁碰壁，节省您的宝贵时间，有效提升发表机率，确保SCI检索（检索不了全额退款）。我们视信誉为生命，多方面确保文章安全保密，在任何情况下都不会泄露您的个人信息或稿件内容。