IEEE设计与测试 SCIE

期刊简介预计审稿时间：

IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

《IEEE 设计与测试》提供原创作品，介绍用于设计和测试微电子系统（从设备和电路到完整的片上系统和嵌入式软件）的模型、方法和工具。该杂志侧重于当前和近期的实践，包括教程、操作方法文章和真实案例研究。该杂志力求通过专栏、访谈和圆桌讨论，向读者介绍重要的技术进步以及技术领导者的观点。主题包括半导体 IC 设计、半导体知识产权模块、设计、验证和测试技术、制造和产量设计、嵌入式软件和系统、低功耗和节能设计、电子设计自动化工具、实用技术和标准。

《Ieee Design & Test》(IEEE设计与测试)编辑部通讯方式为445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141。如果您需要协助投稿或润稿服务，您可以咨询我们的客服老师。我们专注于期刊投稿服务十年，熟悉发表政策，可为您提供一对一投稿指导，避免您在投稿时频繁碰壁，节省您的宝贵时间，有效提升发表机率，确保SCI检索（检索不了全额退款）。我们视信誉为生命，多方面确保文章安全保密，在任何情况下都不会泄露您的个人信息或稿件内容。